Data Sheets

After a good week of personal research and study on conduction mechanisms, at this meeting we discussed the methods of determining the leakage currents in an Oxide dielectric. Using a MIM (metal insulator metal ) capacitor we are going to use Current vs Voltage and Voltage Capacitance characteristics to find which conduction process occurs in the insulator.

The data is collected from two capacitors ei: One with Organic insulator and One with Aluminium oxide insulator. 

Frenkel Poole emission is due to emission of trapped electrons into the conduction band. This is less common in Silicon dioxide because it is more perfect than Aluminium or Titanium oxides. 

 Fowler-Nordheim tunneling is the most common conduction mechanism in insulators under high fields. The energie barrier between the metal contact and insulator reduce when a high voltage is applied. 

This mechanisms can be detected after plotting the graphs.